Abstract
Morphological CHARACTERIZATION OF THE OXIDE SCALE GROWN ON NICKEL DURING CORROSION BY V2 O5
Nickel samples coated with a monitored thickness of V2 O5 have been oxidized at 900°C, under various oxygen pressures, until the weight change reached a given value. The microstructures of the thin films obtained were studied by three non-destructive methods: X-ray diffraction with a low angle of incidence, Auger electron spectroscopy and scanning electron microscopy. A comparison of the results obtained by these analyses shows that the vanadium attacks the growing oxide, forming a honeycomb structure in which is located the so-formed nickel vanadium oxide.