Abstract
Using a 300 kV transmission electron microscope, we present experimental (100) lattice images of GaAs and ZnSe, which allow the resolution and identification of sublattices. A detailed comparison between the experimental and simulated images showed that the screening effect of valence charge electrons, due to crystallization, is not as essential for (100) lattice images of these compounds as for (110) images. The traditional simulation obtained by superposing free atoms can be accurately used to discuss the chemical information such as polarity and atomic structure.