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Original Articles

High-resolution electron microscopy of twin interfaces in massively transformed γ-TiAl

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Pages 975-991 | Received 12 Mar 1996, Published online: 13 Sep 2006
 

Abstract

Twin boundaries in the massively transformed γ-TiAl phase, which is formed in a Ti-48 at.% Al alloy quenched from the high-temperature α-Ti phase field, have been investigated by high-resolution electron microscopy. At the twin boundaries and ledges, a characteristic periodic contrast with a spacing of about 0·7 nm is frequently observed, which corresponds to the three-times periodicity of d{111}γ. This contrast is quite similar to those reported previously for12Aug1996 severely deformed γ + α2 two-phase Ti-Al alloys, which was attributed to the formation of the 9R structure with ABC/BCA/CAB stacking sequence. From close examination of this contrast with the aid of image simulation, it is concluded that the contrast is caused by overlapping twin-related crystals along the incident beam direction and not by formation of the 9R structure. The configuration of overlapping twins is explained by complex ledge structures, which result from the formation of twin-related crystals in the α → γ massive transformation during quenching. Extremely thin hcp plates with a thickness of about 0·8–2·0 nm are found to exist among the massively transformed γ phase. These thin hcp plates are considered to be a retained α phase in the α → γ massive transformation.

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