ABSTRACT
This paper is a revised and updated version of the keynote speaker address for the Block 2 Session: “Data Acquisition in Surface Texture Analysis” for the Online Workshop on Quantitative Artifact Microwear Analysis (QAMA) organized by TraCEr–MONREPOS–RGZM (November 25, 2021) in Neuwied, Germany. It discusses a number of issues related to the acquisition of surface data for texture analysis, including the transition from experimentation to artifact analysis and the importance of standardization of methods. Specifically, the keynote address focuses on eight sub-topics in relation to method development and standardization: (1) Microscopes and operating systems, (2) Magnification, depth of field, working distance, and field of view, (3) Numerical aperture, (4) Cleaning methods, (5) Number and location of surface measurements, (6) Profile versus area measurements, (7) Multiple measurements in the same location, and (8) Surface replication: molds/casts, surface images, and microCT.
Acknowledgments
I would like to thank João Marreiros and the organizers of the Online Workshop on Quantitative Artifact Microwear Analysis (QAMA) at TraCEr–MONREPOS–RGZM, as well as all the presenters and attendees who provided opportunities to discuss many of the current issues facing quantitative microwear analysts in archaeology. My gratitude is also extended to the two reviewers of the original manuscript who provided many constructive comments that greatly improved the final product.
Disclosure Statement
No potential conflict of interest was reported by the author(s).
Additional information
Notes on contributors
W. James Stemp
W. James Stemp (Ph.D. 2000, McGill University) is a Professor in the Department of Sociology, Anthropology and Criminology at Keene State College. His main areas of research include stone tool technology, lithic use-wear analysis, experimental archaeology, quantification of use-wear, and the stone tools of the preceramic peoples of Belize and the ancient Maya.