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Original Articles

A new S2 control chart using repetitive sampling

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Pages 2485-2496 | Received 25 Mar 2014, Accepted 19 Apr 2015, Published online: 12 May 2015
 

Abstract

A new S2 control chart is presented for monitoring the process variance by utilizing a repetitive sampling scheme. The double control limits called inner and outer control limits are proposed, whose coefficients are determined by considering the average run length (ARL) and the average sample number when the process is in control. The proposed control chart is compared with the existing Shewhart S2 control chart in terms of the ARLs. The result shows that the proposed control chart is more efficient than the existing control chart in detecting the process shift.

Acknowledgements

The authors are deeply thankful to the editor, two reviewers for their valuable suggestions to improve the quality of this manuscript. The author, Muhammad Aslam, therefore, acknowledges with thanks DSR for the technical support.

Disclosure statement

No potential conflict of interest was reported by the authors.

Funding

This article was funded by the Deanship of Scientific Research (DSR), King Abdulaziz University, Jeddah.

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