High-temperature thermodynamic properties of nanocrystalline CdSe thin film

ABSTRACT

The thermodynamic properties of the nanocrystalline CdSe (nc-CdSe) thin film were studied by in situ high-temperature X-ray diffraction measurement over the temperature range 288–1073 K. It is shown that nc-CdSe thin film has high thermal stability and no phase transformation up to 1002 K. Lattice parameter, thermal expansion coefficients along c-axis and crystal quality increased with the increase of temperature, but dislocation density and strain decreased with the increase of temperature. Surface effect and size effect are two of the most specific intrinsic properties of nc-CdSe thin films, both of which are of great significance to the thermodynamic properties. This work has provided a reliable basis for the research of nc-CdSe devices at high temperature.

KEYWORDS:

• Nanocrystalline CdSe
• high-temperature X-ray diffraction
• thermodynamic properties

Disclosure statement

No potential conflict of interest was reported by the authors.

Additional information

Funding

The research was supported by Program of Applied Basic Research of Science and Technology Department of Sichuan Province (2014JY0133), Chunhui Plan of the Ministry of Education of China (Z2016122), and the National Natural Science Foundation of China (U1731123).