X-ray diffraction analysis of the layer structure in a ferroelectric liquid crystal with a chiral nematic–chiral smectic C phase transition

Abstract

A half-V-shaped switching ferroelectric liquid crystal (FLC) is a promising candidate for fast response displays. In the half-V FLC display, a liquid crystal with a chiral nematic–chiral smectic C phase transition is used, and the smectic layer is formed by cooling from N* to SmC* with an applied d.c. field. We studied the layer structure by means of X-ray measurements for two axes (ω and χ). By using a point-focused X-ray tube and optimizing the slit width, we succeeded in the two-axis measurement with a commercial X-ray system. The ω–χ profile of the half-V FLC showed two broad peaks in an arc-shaped high-intensity area. Our interpretation of this result is that the major part of the layer consists of a tilted-bookshelf structure and that the minor part consists of a near-bookshelf structure. Since optical microscopy observations on the half-V FLC cells showed a stripe-shaped texture, we consider that the coexistence of the tilted-bookshelf and the near-bookshelf structures forms the stripe-shaped patterns. The radius of the arc-shaped high-intensity area was nearly equal to the molecular tilt angle. This result can explain why the half-V FLC showed a desirable black appearance in spite of the stripe-shaped texture.