X‐ray studies on the crystalline E phase of the 4‐n‐alkyl‐4′‐isothiocyanatobiphenyl homologous series (nBT, n = 2–10)

Abstract

X‐ray diffraction measurements were carried out on nine members of the isothiocyanatobiphenyl homologous series (nBT) in their smectic E (SmE) phase, with the aim of estimating the layer thickness and deriving orthorhombic unit cell parameters for the SmE phase. The data obtained are discussed in relation to molecular reorientation motion around the short axis in that phase.

Keywords:

• X‐ray diffraction
• smectic E phase
• packing parameter
• molecular reorientation

Acknowledgements

Financial support from the Polish Ministry of Sciences grant no. 1 PO3B 060 28 and project “Ionic and plasma nanotechnology of materials formed on C and Si basis” are gratefully acknowledged.

Notes

‡. All computer simulations by Cerius 2 program were run on high‐performance computers of The Academic Computer Centre CYFRONET AGH