Abstract
The cumulative count of conforming (CCC) chart is effective in detecting very low fraction of nonconforming items for high yield manufacturing processes. In this study, a combination of runs rules and variable sampling interval feature is proposed to a lower sided CCC chart by inspecting the items one by one. The performance measures of the control chart are derived by using the Markov chain approach. The numerical comparisons show that the performance of the CCC chart can be improved by adding the runs rules and varying the sampling interval.
Mathematics Subject Classification: