A new multiple dependent state sampling plan based on the process capability index

Abstract

We propose a new multiple dependent state sampling plan which comprises the features of existing multiple dependent state sampling plan and repetitive group sampling plan. We develop this new sampling plan for the inspection of measurable quality characteristics. The proposed plan is developed based on the process capability index C_pk, where the quality characteristic under investigation follows the normal distribution with unknown mean and unknown variance. For the practical application of the proposed new sampling plan industries by, tables are constructed to determine the optimal parameters through a non-linear optimization problem. The advantages of this proposed sampling plan are also discussed.

Keywords:

• Inspection planning
• quality control
• applied statistics
• batch sizing
• lot sizing

Acknowledgments

The authors are thankful to the Editor and the reviewers for their valuable suggestions, which helped to improve the quality of the paper. The work by Chi-Hyuck Jun was supported by the technology development program (S2635405) funded by the Ministry of SMEs.