Constant Stress Accelerated Life Test on a Multiple-Component Series System under Weibull Lifetime Distributions

Abstract

We will discuss the reliability analysis of the constant stress accelerated life test on a series system connected with multiple components under independent Weibull lifetime distributions whose scale parameters are log-linear in the level of the stress variable. The system lifetimes are collected under Type I censoring but the components that cause the systems to fail may or may not be observed. The data are so called masked for the latter case. Maximum likelihood approach and the Bayesian method are considered when the data are masked. Statistical inference on the estimation of the underlying model parameters as well as the mean time to failure and the reliability function will be addressed. Simulation study for a three-component case shows that Bayesian analysis outperforms the maximum likelihood approach especially when the data are highly masked.

Keywords:

• Accelerated life tests
• Weibull distributions
• Series system
• masked data

Mathematics Subject Classification:

• 62N05
• 62N86
• 90B25