Abstract
In order to describe texture and microstructure of a polycrystalline material completely, crystal orientation g = {ϕ1 Φ ϕ2} must be known in all points x = {x 1 x 2 x 3} of the material. This can be achieved by location-resolved diffraction of high-energy, i.e. short-wave, X-rays from synchrotron sources. Highest resolution in the orientation- as well as the location-coordinates can be achieved by three variants of a detector “sweeping” technique in which an area detector is continuously moved during exposure. This technique results in two-dimensionally continuous images which are sections and projections of the six-dimensional “orientation–location” space. Further evaluation of these images depends on whether individual grains are resolved in them or not. Because of the high penetration depth of high-energy synchrotron radiation in matter, this technique is also, and particularly, suitable for the investigation of the interior of big samples.