Monitoring the process mean and variance using a weighted loss function CUSUM scheme with variable sampling intervals

Recent research has shown that adaptive control charts and the CUmulative SUM (CUSUM) schemes are quicker in detecting process shifts than traditional static Shewhart charts. This article proposes a weighted loss function CUSUM (WLC) scheme with Variable Sampling Intervals (VSI). It simultaneously monitors both mean shifts and an increasing variance shift by manipulating a single CUSUM chart. Most importantly, this VSI WLC scheme is much easier to operate and design than a VSI CCC scheme which comprises of three CUSUM charts (two of them monitoring the increasing and decreasing mean shifts and one monitoring the increasing variance shift). In terms of detection efficiency, the VSI WLC scheme is a much more powerful tool than the static X&S chart, the VSI X&S chart and the static WLC scheme. It is even more powerful than the VSI CCC scheme for many different combinations of mean and increasing variance shifts.