Optimum Partially Accelerated Life Test Plans with Progressively Type I Interval-Censored Data

Abstract

Because of continual improvement in manufacturing design, one often deals with high quality products that are highly reliable with a substantially long life span. This article discusses k-level step-stress partially accelerated tests under type I progressive interval censoring with equal inspection intervals of length τ. It is assumed that the lifetime of a testing unit follows a Weibull distribution. The problem of choosing the optimal τ is considered according to a certain optimality criterion. Two selection criteria that enable us to obtain the optimum test plans are investigated. Monte Carlo simulations are presented to illustrate the proposed methods.

Keywords:

• Design
• Inspection
• Partially accelerated step-stress test
• Reliability analysis
• Type I progressive censoring
• Weibull distribution

Subject Classifications:

• 62N01
• 62N05

ACKNOWLEDGMENTS

The author thanks Professor Nitis Mukhopadhyay, Associate Editor, and the reviewers for their valuable time and useful suggestions to improve the quality of the article.

Notes

Recommended by Nitis Mukhopadhyay