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Spectroscopy and transitions

Dielectric constant and long-wavelength refractive index vs. pressure and temperature in semiconductors

Pages 469-475 | Received 13 Sep 2005, Published online: 15 Dec 2009
 

Abstract

The present theoretical and experimental knowledge concerning the dependence of the dielectric constant and the refractive index on pressure and temperature is reviewed.

Acknowledgements

I thank K. Syassen for illuminating discussions and a critical reading of the manuscript.

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