ABSTRACT
In recent years, Bayesian methods have become increasingly popular for solving industrial statistical problems. In this article, we illustrate the use of Bayesian methods to analyze binomial count data collected from a designed experiment. In addition to fitting an appropriate logistic regression model, we show how the Bayesian approach provides an integrated framework to address model goodness-of-fit, model selection, response surface estimation, optimization, and prediction.
ACKNOWLEDGEMENTS
B. Weaver's work was partially funded by NSF grant DMS #0502347 EMSW21-RTG awarded to the Department of Statistics, Iowa State University. M. Hamada thanks C. C. Essix for her support and encouragement.