Attribute Control Charts for the Weibull Distribution under Truncated Life Tests

ABSTRACT

In this article, an attribute control chart is proposed when the lifetime of a product follows a Weibull distribution, which is based on the number of failures from a truncated life test. The coefficients of the proposed control chart and the test duration are determined so that the average run length when the process is in control is close to the target value. Tables reporting the out-of-control average run lengths are given for various shift parameters. A case study is given to illustrate the proposed control chart for industrial use.

KEYWORDS:

• average run length
• control chart
• Weibull distribution

ACKNOWLEDGMENTS

The authors are thankful to the reviewer and associate editor for their valuable suggestions that improved the quality of the article. We are also thankful to Dr. Muhammad Azam and Nasrullah Khan for their help in revision of the article.

FUNDING

The work by Chi-Hyuck Jun was supported by the Basic Science Research Program through the National Research Foundation of Korea (NRF-2011-0012879). This article was also funded by the Deanship of Scientific Research (DSR), King Abdulaziz University, Jeddah. Muhammad Aslam therefore acknowledges with thanks DSR technical and financial support.