A group multiple dependent state sampling plan using truncated life test for the Weibull distribution

Abstract

Group and conditional sampling methods have been recently developed to apply in industrial environments. Based on the combination of two group and conditional schemes, this article introduces a group multiple dependent state sampling plan for a truncated life test when the lifetime of item follows the Weibull distribution. The proposed plan can be applied when the quality history of process is accessible and a multiple number of items are installed as a group in each tester. The proposed plan has merits which are illustrated via a comparative study over the existing group acceptance sampling plan. Furthermore, a real example is provided.

Keywords:

• Acceptance sampling
• group sampling plan
• multiple dependent state sampling plan
• the Weibull distribution
• truncated life test

About the authors

Bahram Sadeghpour Gildeh is a professor of Statistics at the Ferdowsi University of Mashhad, Iran. He received his MSc in Mathematical Statistics at the Ferdowsi University of Mashhad (Iran) and PhD in Informatics at the Blaise Pascal University (France). His research interests include statistical quality control, process capability analysis, and fuzzy statistics.

Adel Ahmadi Nadi received his MSc in Mathematical Statistics at the Ferdowsi University of Mashhad, Iran. He is now a PhD student at the Ferdowsi University of Mashhad (Iran). His research interests include statistical quality control and acceptance sampling plan.

Acknowledgments

The authors would like to thank the reviewers and the editor for their valuable comments and suggestions to improve the quality of the manuscript.