Designing Quality (Yield) and Reliability into Circuits

Click to increase image sizeClick to decrease image size

Additional information

Notes on contributors

Menberu Lulu

About the Author. Menberu Lulu is associate professor of industrial and systems engineering at Florida International University, Miami. He received a B.S. in industrial engineering from the Georgia Institute of Technology. He earned a M.S. and Ph.D. in industrial engineering from the University of Alabama (Tuscaloosa) and the University of Alabama in Huntsville, respectively. He has held previous academic appointments at the University of Alabama in Huntsville and at the University of South Florida. His research interests are in quality and reliability engineering, simulation, and manufacturing systems.