Electromagnetic diffraction modeling of the finite multi-dielectric thickness in metallic wave-guides using GEC method: application to the characterization of vegetation leaves

Abstract

In this paper, a new approach for electromagnetic modeling of the diffraction of finite multi-dielectric thickness in metallic wave-guides is presented. The proposed model, based on the method of moments combined to the generalized equivalent circuit, can concern several applications such as the investigation of vegetation leaves properties. Hence, in this work, we are interested in studying a corn leaf which is assumed as a superposition of rectangular dielectric slabs. We develop an electromagnetic analysis of a rectangular wave-guide loaded with a dielectric model that is composed of a leaf plant with a finite thickness. Interest has been focused on the influence of the wave diffraction according to the geometrical intern of the corn leaves. In this paper, we are particularly interested in studying these parameters against the dielectrics widths and the distances separating them. To validate this work, the obtained results are compared with those previously measured and published. A good agreement with literature is shown.

Keywords:

• GECM
• electromagnetic wave diffraction
• dielectric-loaded wave-guides
• vegetation leaves

Notes

No potential conflict of interest was reported by the authors.

Additional information

Funding

This work was supported by Houssemeddine Krraoui, Fethi Mejri and Aguili Taoufik.