Abstract
Electromagnetically induced transparency (EIT) effect in a -system formed by Cs atoms
line, enclosed in nanometric-thin cells, is studied both experimentally and theoretically for the first time. The atomic column thickness
varies in the range of 50–1500 nm. It is demonstrated that when the coupling laser frequency is in exact resonance with the corresponding atomic transition, the parameters of the EIT resonance (also called dark resonance (DR)) depend weakly on
, which allows us to detect DR at
nm with the contrast of
. The obtained DR parameters are the best as compared with those for Rb
and
lines and Cs
line. The DR contrast and width are studied versus laser frequency detunings, coupling laser power, cell thickness, temperature, and applied external magnetic field. The well-resolved splitting of the DR resonance in a magnetic field for
nm can be used for magnetometry with high spatial resolution. The theoretical model describes well the observed results.