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Erratum

Erratum

This article refers to:
Afterpulsing studies of low-noise InGaAs/InP single-photon negative-feedback avalanche diodes
Measurement-device-independent quantum key distribution: from idea towards application
Characterization, 1064 nm photon signals and background events of a tungsten TES detector for the ALPS experiment
Two-dimensional infrared and mid-infrared imaging by single-photon frequency upconversion

Due to an unfortunate production error, four articles intended for this Special Issue were mistakenly assigned to an earlier issue (Volume 62, issue 14).

Measurement-device-independent quantum key distribution: from idea towards application

Raju Valivarth, Itzel Lucio-Martinez, Philip Chan, Allison Rubenok, Caleb John, Daniel Korchinski, Cooper Duffin, Francesco Marsili, Varun Verma, Mathew D. Shaw, Jeffrey A. Stern, SaeWoo Nam, Daniel Oblak, Qiang Zhou, Joshua A. Slater and Wolfgang Tittel

Journal of Modern Optics, 2015

Vol. 62, Nos. 13–14, 1141–1150, http://dx.doi.org/10.1080/09500340.2015.1021725

Afterpulsing studies of low-noise InGaAs/InP single-photon negative-feedback avalanche diodes

Boris Korzh, Tommaso Lunghi, Kateryna Kuzmenko, Gianluca Boso and Hugo Zbinden

Journal of Modern Optics, 2015

Vol. 62, Nos. 13–14, 1151–1157, http://dx.doi.org/10.1080/09500340.2015.1024294

Characterization, 1064nm photon signals and background events of a tungsten TES detector for the ALPS experiment

J. Dreyling-Eschweiler, N. Bastidon, B. Döbrich, D. Horns, F. Januschek and A. Lindner

Journal of Modern Optics, 2015

Vol. 62, Nos. 13–14, 1132–1140, http://dx.doi.org/10.1080/09500340.2015.1021723

Two-dimensional infrared and mid-infrared imaging by single-photon frequency upconversion

Ruikai Tang, Wenjie Wu, Xiongjie Li, Haifeng Pan, E Wu and Heping Zeng

Journal of Modern Optics, 2015

Vol. 62, Nos. 13–14, 1126–1131, http://dx.doi.org/10.1080/09500340.2015.1021722

Taylor & Francis apologises for this error.

For the convenience of print readers, these articles have been reprinted in the print edition (Volume 62, issue 19–20) of the Special Issue. However, the articles should be cited using their original catchline details as listed above.

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