Propagation model and error analysis of an E-field sensor based on pockels effect and waveguide

Abstract

Electric field measurement sensors based on the crystal Pockels effect are widely used. Currently, the development aims for electric field sensors are mainly focused on miniaturizing and integrating the sensor structure and improving measurement sensitivity and precision. The goal of this study was to analyse the sources of error in Pockels effect electric field measurement sensors, consider the mutual influence and accumulation effect of the various error factors, and establish a basic mathematical model of the measurement system with error components. Calculation and analysis were used to classify the function and change trend of several main errors, providing reference data for the structure design and error compensation of the sensor. The results show that the polarizing angle and the analyser angle have the same influence on assembly error. The inherent error is positively related to the electric field intensity. The periodic accumulation characteristic error under large electric field is also discussed. In order to avoid this error under an intense electric field, a suitable test electric field range was determined.

Keywords:

• Pockels effect
• electric field measurement
• electro-optical sensor
• inherent error

Acknowledgement

The study was done in the State Key Laboratory of Electrical Insulation and Power Equipment of Xi’an JiaoTong University, Xi’an, P.R. China.