Abstract
High-quality La1.89Ce0.11CuO4/Ba0.5Sr0.5TiO3/La0.88Sr0.12MnO3 heterostructures grown on SrTiO3 enable a variety of electronic devices. The performance of such devices depends strongly on the interfacial microstructure of the heterostructures. Here, we use high-resolution transmission electron microscopy to reveal the structure and microstructure of La1.89Ce0.11CuO4/Ba0.5Sr0.5TiO3/La0.88Sr0.12MnO3 heterostructures. A step at the interface between La1.89Ce0.11CuO4 and Ba0.5Sr0.5TiO3 layers is found to have a height of about 1.36 nm. The interfacial structures on both sides of the step at the atomic level are revealed by image processing and image simulation. Major defects in the Ba0.5Sr0.5TiO3 and La0.88Sr0.12MnO3 layers are dislocations with a Burgers vector of a [1 0 0].
Acknowledgements
The authors thank Miss Y. Li for her help in sample preparations.
Funding
This project is supported by the National Natural Science Foundation of China [grant number 51102275] and the Special Funds for Major State Basic Research Projects [grant number 2010CB934200].