Structure refinement of quasicrystalline Al₆₂Cu₂₀Co₁₅Si₃ by electron channelling

Abstract

The enhanced X-ray production by channelled electrons is used to investigate the planarity of the periodically stacked (00001) planes in decagonal Al₆₂Cu₂₀Co₁₅Si₃. The results strongly suggest that the planes are not perfectly flat as assumed in previous models but that a fraction of the Al atoms and probably all Si atoms are displaced out of the planes.