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Abstract
Large millimetre-sized grains of Al[sbnd]Cu[sbnd]Fe grown by the annealing technique developed at the Centre d'Etudes de Chimie Métallurgique in Vitry, France, and subgrains cut in centimetre-sized Al[sbnd]Pd[sbnd]Mn quasicrystals grown by solidification (Bridgman-Czochralsk) at the Laboratoire de Thermodynamique et Physicochimie Métallurgiques in Grenoble, France, were investigated by X-ray topography. Two types of defect were identified: loops and bands. Both the nature of the strain field around these defects and their origin are discussed.