Effectiveness of 1·5 keV Aluminium K and 0·3 keV Carbon K Characteristic X-rays at Inducing DNA Double-strand Breaks in Yeast Cells

Summary

Induction of DNA double-strand breaks in diploid wild-type yeast cells, and inactivation of diploid mutant cells (rad54-3) unable to repair DNA double-strand breaks, were studied with aluminium K (1·5 keV) and carbon K (0·278 keV) characteristic X-rays. The induction of DNA double-strand breaks was found to increase linearly with absorbed dose for both characteristic X-rays. Carbon K X-rays were more effective than aluminium K X-rays. Relative to ⁶⁰Co γ-rays the r.b.e-values for the induction of DNA double-strand breaks were found to be 3·8 and 2·2 for carbon K and aluminium K X-rays respectively. The survival curves of the rad54-3 mutant cells were exponential for both ultrasoft X-rays. For inactivation of rad54-3 mutant cells, the r.b.e.-values relative to ⁶⁰Co γ-rays were 2·6 and 2·4 for carbon K and aluminium K X-rays, respectively. The DNA double-strand break data obtained with aluminium K and carbon K X-rays are in agreement with the data obtained for gene mutation, chromosome aberrations and inactivation of mammalian cells, suggesting that DNA double-strand breaks are the possible molecular lesions leading to these effects

• double-strand breaks
• yeast cell inactivation
• ultrasoft X-rays
• yeast mutant
• rad54-3