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Original Article

Possible Occurrence of DNA Double-strand Breaks during Repair of U.V.-induced Damage in Yeast

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Pages 107-113 | Received 10 Oct 1986, Accepted 23 Dec 1986, Published online: 03 Jul 2009
 

Summary

The yeast mutant rad54-3, which is temperature conditional for dsb rejoining, is sensitive to u.v. light when held at the restrictive temperature following exposure. We propose that this is attributable to the enzymatic formation of dsb in DNA containing u.v. lesions and a subsequent lack of dsb repair in this mutant.

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