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Original Articles

WEIBULL PARAMETERS' TREND UNDER VARYING PRODUCTION LOTS

Pages 219-224 | Received 01 Aug 2005, Accepted 01 Jul 2006, Published online: 09 Feb 2010
 

ABSTRACT

Based on warranty databases, this article is a study of how the variation of Weibull parameters in different production lots affects the reliability of electronic appliance. Three-parameter Weibull distribution is performed to simulate product failure mode and Weibull probability paper is used to define the shape, scale and location parameter for each production lot. Two computer motherboard cases are studied under free repair/replacement warranty condition. The results demonstrate the location parameter (γ) is not zero and approaches a constant of 480 hours, under a smoothly fulfillment process. Most of time the shape parameter (β) is close to 1.0. Both the shape and scale (η) parameters significantly reflect product durability. Finally, the reliability trend is affected by parameters set on varying production lots and will decline to 0.95 and 0.90 while operational time moves to 1.5% and 2.5% of MTBF respectively.

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