Abstract
A three-wavelength method based on Cauchy or Sellmeier formulas is proposed for simultaneous determination of the thickness and refractive index without using approximate expansions of the refraction index over the wavelength. The method is also applicable for the simultaneous determination of other optical characteristics together with the refractive index. To test the applicability of the proposed method, the refractive index and thickness of ultrathin polysulfone film were obtained in the surface plasmon resonance experiment.
Acknowledgement
The authors are thankful to Dr. Gilad Orr for technical support and useful discussions.