ABSTRACT
The present study investigates the influence of substrate bias on edge-rounding of TiAlN-coated drill bits arising out of coating deposition and the resulting cutting performance while machining Inconel 718. Tungsten carbide (WC) drill bits were deposited with TiAlN coating through a cathodic arc physical vapor deposition (CAPVD) system. Five different substrate bias voltages varying from −20 V to −60 V were employed for the deposition. The hardness, adhesion strength, and residual stress were significantly influenced by substrate bias. The sharp edges of coated drill bits exhibited significant edge-rounding at relatively higher levels of substrate bias. The reason for such edge-rounding is the re-sputtering and residual stress-induced micro-chipping of the previously formed coating layer during the deposition. The edge-rounding of drill bits was in the order of: 20 V <30 V <40 V <50 V <60 V. The drill bits deposited at −50 V substrate bias exhibited the best tool life owing to optimum edge radius (resulting in better edge stability) and coating properties. The present study helps identify an optimum level of substrate bias, which results in a favorable edge radius and the best tool life of the coated drill bits.
Highlights
The influence of substrate bias on post-deposition edge-rounding of drill bits is highlighted
The edge-rounding of sharp edges of drill bits increased with increasing substrate bias
The post-deposition edge-rounding of drill bits was a combined result of re-sputtering and residual stress-induced micro-chipping
The best tool life resulted from an optimum edge radius of drill bits and coating properties
A relatively higher substrate bias resulted in the poor surface finish of drilled holes
Acknowledgments
The authors greatly acknowledge Department of Science & Technology (DST), Government of India for financial support vide sanction order: DST/TMD/CERI/CleanCoal/2017/036. Permission granted by Director, ARCI, to publish this work is also gratefully acknowledged.
Disclosure statement
No potential conflict of interest was reported by the author(s).