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Integrated Ferroelectrics
An International Journal
Volume 29, 2000 - Issue 3-4
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Original Articles

Performance of ferroelectric based tunable capacitors as a function of electrode geometry

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Pages 215-223 | Received 03 Sep 1999, Published online: 19 Aug 2006
 

Abstract

High quality Ba0.4Sr0.6TiO3 and SrTiO3 films were grown by Pulsed Laser Deposition on single crystal LaAlO3 and MgO substrates. Temperature dependencies of the dielectric constant and loss tangent of the films were studied using planar interdigitated test capacitors with various electrode geometries. The temperature where the maximum or “peak” capacitance occurs (Tp and referred to as the “peak temperature”) is found to depend on the electrode geometry in these films. As much as 40 K difference in Tp was observed between the STO test capacitors with 5 μm and 40 μm gaps between electrodes. Interface built-in electric field and metal-ferroelectric thermal mismatch strain are considered as possible explanation of the effect of electrode geometry on peak temperature of the capacitors.

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