Abstract
Pb(Zr0.52Ti0.48)O3 thin films were fabricated on Pt/Ti/SiO2/Si substrates by the sol-gel method. A UV-photolysis process was added before the final annealing of the coated films. This UV-photolysis process made it possible to lower the crystallization temperature and to stabilize the film surface and interface during the annealing process. The UV-photolysis-processed PZT thin films exhibited enhanced ferroelectricity and a lower leakage current density than the non-treated ones. It is thought that the UV-treatment process is a very effective in enhancing ferroelectric and electrical properties for the ferroelectric random access memory device applications.
ACKNOWLEDGEMENT
This work was supported by grant No. R01-2003-000-10027-0 from the Korea Science & Engineering Foundation.