ABSTRACT
Lead-free piezoelectric films with thickness larger than 1 μm integrated on silicon substrate have been receiving considerable attention for environmental concern and potential applications in micro-electro-mechanical systems. By chemical solution deposition, it is possible to process (100)-predominant 1 μm BaTiO3 films on LaNiO3/Pt/TiO x /SiO2/Si substrates by using the same thinner high crystallinity columnar films as buffer layers. We point out that this kind of buffer layer on the surface of LaNiO3/Pt electrode is effective to enhance the crystallinity and orientation degree of the BaTiO3 films. The 1 μm BaTiO3 films showed good dielectric and insulative characteristic against applied field. Also, the (100)-predominant 1 μm BaTiO3 films have excellent piezoelectric properties, piezoelectric coefficients d 33 higher than 50 pm/V have been detected by the atomic force microscope on the bare films, which is comparable to that of Pb(Zr,Ti)O3 films. These results indicate that the highly (100)-oriented BaTiO3should be a promising candidate as the lead-free piezoelectric films for micro-electro-mechanical systems applications.