Abstract
This paper presents a mathematical model characterizing the behavior of a common-source (CS) amplifier using a ferroelectric field-effect transistor (FeFET). The model is based on empirical data and incorporates several variables that affect the output, including frequency, load resistance, and gate-to-source voltage. Since the common-source amplifier is the most widely used amplifier in MOS technology, understanding and modeling the behavior of the FeFET-based common-source amplifier will help in the integration of FeFETs into many circuits.