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Integrated Ferroelectrics
An International Journal
Volume 133, 2012 - Issue 1
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Session D: Ferroelectrics Experimental

Distribution of Crystal Structure in Epitaxial Pb(Zr0.42,Ti0.58)O3 Film Grown on (111)cSrRuO3//(111)SrTiO3 Substrate

, , , , , & show all
Pages 54-60 | Received 15 Sep 2011, Published online: 20 Apr 2012
 

Abstract

Distribution of crystal structure along the thickness direction for the epitaxial Pb(Zr,Ti)O3 thick film on (111) c SrRuO3//(111)SrTiO3 substrate with Zr/(Zr + Ti) = 0.42 was investigated using micro-Raman spectroscopy. The XRD result showed that the Pb(Zr,Ti)O3 thick film consisted of the mixture of the tetragonal and rhombohedral phases. In addition, it was revealed by micro-Raman spectroscopy that the rhombohedral phase was dominant near the substrate. This trend was opposite from that of the Pb(Zr,Ti)O3 thick film on (100) c SrRuO3//(100)SrTiO3 substrate. These results indicate that the distribution of crystal structure along the thickness direction for the Pb(Zr,Ti)O3 films depends on the crystal orientation of the films.

Acknowledgments

This work partly was supported by the Sasagawa Scientific Research Grant from the Japan Science Society.

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