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Abstract
Ferroelectric poly(vinylidene fluoride-trifluoroethylene) [P(VDF-TrFE)] (70/30) copolymer thin films were prepared by spin-coating method. The microstructure and morphology of P(VDF-TrFE) thin films annealed at different temperatures (70°C-160°C) were investigated by atom force microscope and X-ray diffraction techniques, which reveal the crystallization of P(VDF-TrFE) films is greatly affected by the annealing temperature. With the increase of annealing temperature, the grains of P(VDF-TrFE) thin film change from small spheroids to long needle-like structures. The most rapid change occurs between 136°C–140°C. The surface roughness and the grain size of P(VDF-TrFE) film show similar change with the annealing temperature.
Acknowledgments
This work is supported by the National Natural Science Foundation of China (61025021, 60936002, 60729308, and 51072089), National Key Projects of Science, Technology (2009ZX02023–001-3), International Cooperation Project from Ministry of Science and Technology of China (2008DFA12000) and Foundation of State Key Laboratory of Electronic Thin Films and Integrated Devices, University of Electronic Science and Technology of China, Chengdu (KFJJ200904).
This paper was originally slated for inclusion in the Proceedings of the International Symposium on Integrated Functionalities (ISIF 2011) which published in Integrated Ferroelectrics, volumes 132–134.