Abstract
Pt/BaTiO3-BiFeO3/Nb:SrTiO3 based memristors were fabricated and their current–voltage (I–V) characteristics were studied in order to facilitate integration with analog/digital computations. Piecewise non-linear I–V characteristic equations of the ferroelectric memristor were obtained using non-linear regression techniques. An equivalent circuit for the fabricated memristors was obtained comprising of internal current, film resistance, and voltage dependent resistance. Utilizing the equivalent circuit model, a three bit general purpose Finite State Machine was developed and simulated results were found to match with the fabricated FSM device results.