![Sample our Physical Sciences journals, sign in here to start your FREE access for 14 days]({"type":"image" , "src" : "/sda/110819/TOC-Subject-Sample-2021-Physical-Sciences.jpg"})
Abstract
We used the Scanning Nearfield Acoustic Microscope-a nontouching profilometer with a conducting tip-both to pole thin ferroelectric VDF-TrFE copolymer films and to subsequently monitor the resulting pie-zoelectrically stimulated surface motion. For thin uncovered polymer films we were able to measure simultaneously the piezoactivity and the surface topography with a lateral resolution of 1 μm.
Furthermore we used a focused electron beam to create a poling pattern of narrow lateral extension and detected the corresponding local piezoactivity by using the Scanning Nearfield Acoustic Microscope.