Time-Resolved X-Ray Studies of Layer Behaviour During Operation of a Ferroelectric Device

Abstract

Time-resolved small angle x-ray diffraction experiments have been undertaken for the first time throughout the switching cycle of a ferroelectric liquid crystal device. The x-ray data show that during switching with a low electric field the chevron structure adopted by the layers distorts, changing the chevron angle. Further, a rotation of the layers in the plane of the device is observed, coincident with the change in chevron angle. The motion of the layers takes place on a ten microsecond time scale and the angular rotation of the layers is approximately 1 °.