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Abstract
Pure ZnO and Cu-doped ZnO thin films were prepared by successive ionic layer adsorption and reaction method with a Copper concentration of 0·05 and 0·1 mol%. The X-ray diffraction pattern confirmed that the films were polycrystalline in nature with a hexagonal wurtzite structure. The Scanning Electron Microscopy revealed a rod-like shaped grains and the compositional analysis confirmed the presence of Zn, O and Cu in the films. Atomic Force Microscopy and Ultra violet spectroscopy revealed that the surface roughness and band gap values of the films decreases with the increase of copper concentration. The presence of functional groups and chemical bonding was confirmed by infra spectra. Photo luminescence spectra showed that the intensity of the UV emission increases and green emission decreases with the increase of copper concentrations which confirmed the substitution of Cu into the ZnO lattice.