Distinctive applications of synchrotron radiation based X-ray Raman scattering spectroscopy: a minireview

Abstract

Third-generation synchrotron radiation sources with improving new techniques provide opportunities to perform many promising experiments. X-ray Raman scattering (XRS) is one of the synchrotron radiation based techniques for the investigation of soft X-ray absorption edges (∼50-1000 eV) using hard X-rays (∼10 keV). This technique allows the examination of the K-shell excitations of light elements and L- and M-shell excitations of 3d transition metals with bulk-sensitivity. XRS is preferred to conventional soft X-ray absorption spectroscopy (XAS) for complicated sample conditions, since the technique does not require vacuum. Structural and electronic properties of rechargable batteries or hydrogen storage devices in operation, inner Earth elements under realistic conditions can be studied, liquids, weakly ordered solids and gas samples can be examined, and ancient/historic materials comprising organic compounds can be discriminated using XRS spectroscopy. In this study, XRS is described briefly and the distinctive applications in different research areas are highlighted.

Keywords:

• Inelastic X-ray scattering
• low-energy absorption edges
• X-ray Raman scattering

Acknowledgments

The author acknowledges Manuel Harder, Georg Spiekermann, Hasan Yavaş, and Hans-Christian Wille for their valuable support.

Disclosure statement

No potential conflict of interest was reported by the author(s).