Novel multi-frame super resolution algorithm for X-ray diffraction (XRD)

Abstract

The spatial distribution of signals in X-ray diffraction (XRD) may be very narrow, posing challenges in obtaining high angular resolution results through traditional methods. This article explores multi-frame super-resolution algorithms from the field of image processing, selecting and refining the best suited to the requirements of the crystal truncation rod (CTR) test. Consequently, a new algorithm with a corresponding methodology is proposed. This approach is subsequently applied to characterize the CTR signal of SrTiO₃ single-crystal samples, effectively enhancing the clarity of blurry and rough CTR cross-section signals. The resolution with this method surpasses that obtained using the pixel size alone, which is beneficial for characterizing weak signals. By combining data in three dimensions, a significantly enhanced three-dimensional CTR signal is obtained. This method enables the extraction of otherwise difficult-to-obtain information and can be conveniently integrated into subsequent theoretical work. Moreover, these methods hold potential for application in other techniques that require improved resolution under similar conditions.

Keywords:

• Crystal truncation rod (CTR)
• multi-frame super resolution
• X-ray diffraction (XRD)

Acknowledgements

The authors thank the Surface Diffraction Beamline (BL02U2) of Shanghai Synchrotron Radiation Facility (SSRF) for providing the beamtime.

Disclosure statement

No potential conflict of interest was reported by the author(s).

Additional information

Funding

This work was supported by the National Natural Science Foundation of China under Grant No. [52271126].