ABSTRACT
Pure and tungsten (W) doped ZnO thin films have been successfully deposited on glass substrates by successive ionic layer adsorption and reaction (SILAR) method. Effect of W doping causes the change of strained stress in ZnO films, which subsequently affected its structural and optical properties. The prepared films possessed a polycrystalline hexagonal wurtzite structure as seen from the X-ray diffraction (XRD). The SEM images show that W-doped ZnO thin films exhibit the presence of uniform coating and the film comprises nanostructured particles grown all over its surface. The transmittance spectra indicate that W doping can increase the optical bandgap of ZnO thin films. The optical energy gap of the films was estimated from Tauc’s law and observed to be an increasing tendency with increase in W doping concentration. The band edge emission shifts towards the blue region with increasing amount of W doping.
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Notes on contributors
A. Sales Amalraj
Dr. A. Sales Amalraj has received his Ph.D. in physics. He is working as an Assistant Professor in Department of Physics, Sree Sevugan Annamalai college, Devakottai. He has published 7 publications in peer-reviewed journals and holds several awards and honours. His current research interest includes ceramics, and thin films prepared by sol-gel and SILAR method.
S. Christina Joycee
Mrs. S. Christina Joycee pursues Ph.D. in Chemistry under Madurai Kamaraj University, Madurai. Currently, she is an assistant professor in the Department of Chemistry, St. Antony’s College of Arts and Sciences for Women, Dindigul.
G. Natarajan
Dr. G. Natarajan received his Ph.D. in physics from Gandhi Gram Rural University, Dindigul. Since 1983, he is working as a Professor and head of the department in Department of Physics, PSNA College of Engineering and Technology, Dindigul. He is the author/co-author of over 10 publications in peer-reviewed journals and holds several awards and honours. His current research interest includes ceramics, multiferroics and thin films.