Nanoelectromechanics of piezoelectric indentation and applications to scanning probe microscopies of ferroelectric materials

Abstract

Nanoelectromechanics of piezoelectric indentation, including the structure of coupled electroelastic fields and stiffness relations, is analysed for flat, spherical, and conical indenter geometries. Exact solutions in elementary functions for electroelastic fields inside the material are obtained using the recently established correspondence principle between the elastic and the piezoelectric problems. The stiffness relations fully describe the indentation process and relate indentation depth, indentation force and bias to the relevant material properties and indenter parameters. This extends the results of Hertzian mechanics to piezoelectric materials. The stiffness relations are utilized for quantitative understanding of the electromechanical scanning probe microscopies (SPM) of ferroelectric and piezoelectric materials, including piezoresponse force microscopy, atomic force acoustic microscopy, scanning near-field acoustic microscopy, and heterodyne ultrasonic-electrostatic force microscopy. The structure of the electroelastic field yields a quantitative measure of signal generation volume in electromechanical SPMs and also provides a quantitative basis for the analysis of tip-induced polarisation switching and local hysteresis loop measurements.

Acknowledgements

One of the authors (SVK) is supported as a Eugene P. Wigner Fellow and staff member at the Oak Ridge National Laboratory, managed by UT-Battelle, LLC, for the US Department of Energy under Contract DE-AC05-00OR22725. Support by ORNL SEED funding (EK, MK, and SVK) is acknowledged.