Preparation and thermoelectric power of SnBi₄Se₇

Abstract

Polycrystalline samples of Bi₂Se₃ and a stoichiometric ternary compound in the quasi-binary system SnSe–Bi₂Se₃ have been prepared and characterized by X-ray powder diffraction analysis. At room temperature the carrier concentration values are n = 1.1 × 10¹⁹ cm⁻³ for Bi₂Se₃ and n = 0.53 × 10¹⁹ cm⁻³ for SnBi₄Se₇. The thermoelectric power has been measured over the temperature range 90–420 K. The thermoelectric power of Bi₂Se₃ is higher than that for SnBi₄Se₇, which shows that the Sn impurity has an acceptor character. Therefore, doping Bi₂Se₃ with tin atoms does not improve thermoelectric properties of this material, due to decrease the value of the power factor σS ². Transport properties of the studied polycrystalline samples are characterized by a mixed transport mechanism of free carriers. It is necessary to add more than one Sn atom to the Bi₂Se₃ compound in order to suppress the electron concentration by one electron. Such behaviour of the dopant is explained by the formation of various structural defects. Besides the dominant substitutional defect, Sn_Bi, tin atoms also form uncharged defects, corresponding to seven-layer lamellae of the composition Se–Bi–Se–Sn–Se–Bi–Se which corresponds to the structure of the SnBi₂Se₄.