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Abstract
For many years, theoretical studies using model and ab initio potentials have predicated the existence of a liquid/liquid phase transition in silicon, based on a continuous change of the liquid A5 structure to A4. In contrast, we report here a quantitative analysis of data from high-energy X-ray diffraction measurements of containerlessly-processed supercooled liquid silicon that demonstrates that the fractions of regions with A5 and A4 order instead remain essentially constant with supercooling, but that the coherence length of the A5 order increases.
Acknowledgements
The work at Washington University was partially supported by the NSF under grant DMR-06-06065 and by NASA under Contract No. NNM04AA016. MUCAT and the Ames Laboratory are supported by the U.S. Department of Energy, Office of Science under Contract No. W-7405-Eng-82.