Intergrowth microstructures of MnF₂ subjected to shock compression

Abstract

Intergrowth microstructures of MnF₂ subjected to shock compression at 4.4, 9.0 and 21.6 GPa were examined using transmission electron microscopy (TEM). Intergrowth microstructures consisting of rutile- and α-PbO₂-type phases were observed in samples shock-loaded to 4.4 and 9 GPa. The sample subjected to 21.6 GPa consisted of a twin structure with stacking faults, with a rutile-type but not the α-PbO₂-type phase. In the 9.0-GPa shocked sample, the phase ledge structure originating from a phase transition is directly captured by high-resolution transmission electron microscopy.

Keywords:

• shock compression
• intergrowth
• ledge structure
• electron diffraction
• high-resolution transmission
• electron microscopy image

Acknowledgement

The authors thank Emeritus Professor Kenji Hiraga for valuable discussions.