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Original Articles

Finite element simulation and experimental determination of interfacial adhesion properties by wedge indentation

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Pages 1395-1413 | Received 23 Oct 2008, Accepted 10 Apr 2009, Published online: 11 Oct 2010
 

Abstract

This paper presents our recent study on determination of interfacial adhesion properties of soft-film-on-hard-substrate (SFHS) systems using finite element simulation (FEM) and wedge indentation experiments. The objectives of this study are: (i) to simulate the interfacial delamination processes during wedge indentation experiments; (ii) to study the effects of interfacial delamination on the characteristics of the indentation load–displacement (P–h) curves, (iii) to determine the interfacial adhesion properties; and (iv) to compare the simulation and experimental results. During the FEM simulation, a traction-separation law is used to describe the interfacial adhesion properties due to the large-scale yielding during indentations. The effects of main parameters in the traction-separation law, i.e. interfacial strength and interfacial energy, to the initiation of interfacial delamination are studied by parametric studies. An interface energy-strength contour, which can be used to determine the interfacial adhesion properties of the thin-film/substrate systems based on a wedge indentation experiment, is developed from the outcomes of the FEM simulation of the indentations using wedge tips with the inclusion angles of 90° and 120°. Using the respective interface energy-strength contours, the interfacial energy and strength of a BlackDiamond® (BD)/Si system and a methylsilsesquioxane (MSQ)/Si system are determined. The simulated results are then compared with the previous experimentally derived interfacial fracture toughness values and some further discussions are given.

Acknowledgement

This work was supported by National University of Singapore under Academic Research Funds (R265-000-190-112 and R265-000-190-133).

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