Statistical analyses of repolarisation current of a PZT film deposited on ITO electrode with different thermal treatments

Abstract

In the vast application fields of lead zirconate titanate (PZT) thin films, of particular interest are the interaction effects occurring at the ferroelectric–substrate interface [E. Bruno, M.P. De Santo, M. Castriota, S. Marino, G. Strangi, E. Cazzanelli and N. Scaramuzza, J. Appl. Phys. 103 (2008) p.064103; S. Dunn and R.W. Whatmore, J. Eur. Ceram. Soc. 22 (2002) p.825]. Relevant for this purpose are polarity-sensitive liquid crystals (LC) cells and micro- and nanoelectronic applications [S. Marino, M. Castriota, G. Strangi, E. Cazzanelli and N. Scaramuzza, J. Appl. Phys. 102, selected for Virtual Journal of Nanoscale Science & Technology, 30 July 2007 (2007) p.013002]. The polarisation current was investigated of a PZT film (PbZr_0.47Ti_0.53O₃) obtained by sol–gel synthesis and deposited by spin coating on an indium tin oxide (ITO) electrode. The different behaviour exhibited by such a system when the support electrode was previously submitted to a thermal treatment was attributed to the change of the electrical properties of the ITO layer. In particular, a higher negative charge in the conductive band of the ITO electrode seems to be responsible for a higher order in the ferroelectric film.

Keywords:

• PZT film
• repolarisation current
• thermal treatment
• ferroelectric properties

Acknowledgement

The authors are greatly indebted to Professor R. Bartolino for his helpful discussions.